白光干涉仪和光谱共焦传感器的区别

the surface measurements are critical to the successful manufacturing of tight toleranced precision parts for instance in the automotive and many other industries scanning white light interferometry is vastly superior to traditional contact measurement methods and has become the preferred tool for industrial quality control of precision part geometry and surface finish polytex top map systems measure vertical height with sub nanometer resolution and very low measurement uncertainty they allow large surface area measurements up to several centimeters across quickly and with high reproducibility the telecentric optical design enables highly repeatable measurements even inside drill holes up to seventy millimeters， deep structures and surfaces can be examined quickly and checked for defects textures and form parameters as well as standardized parameters like flatness according to iso eleven o one to make a measurement the sample is placed under the instrument hood as soon as the measurement is started the acquired sample points are drawn onto the video image in the measurement window， the time for routine measurements can be optimized down to a few seconds for a semi automated operation positioning devices for palette feeding are available that allow a standardized measurement and evaluation procedure polytech also offers measurement systems and work stations that can be easily integrated for inline or atline inspection the topography software provides outstanding two d and three d data representation of structure heights and shape on both rough and specular surfaces with sun nanometer resolution， the data evaluation can be enhanced with various settings filter， algorithms and profile cuts the topography measurement is based on a technique called white light interferometery polytex scanning white light interferometer is a special type of michaelson interferometer that scans the surface height of the test object to achieve this a beam splitter divides the beam coming from a white light source into two parts the reference beam is reflected from a reference plane， while the measurement beam is incident on the test object when changing the distance between the sample and the interferometer optical interference occurs at every point of the surface where the optical path length is exactly the same for the reference and the measurement beam during the vertical scan the interference patterns are captured by the video camera， while the software computes the topography from this data。